【摘要】 介绍用ＵＶ光电法测量ＭＣＰ电子增益时，ＵＶ透过金薄膜的附加输出给测量带来的影响，给出了实验结果并进行初步分析，最后指出确保增益测量结果可靠性的途径。更多还原

【Abstract】 The effect of additional output of UV trans mitting through metal thin film on the measurement of MCP electronic gain with UV photoelectric method is described and the experimental result is given and a preliminary analysis is carried out. Finally, an approach to guarantee the reliability of gain measurement result is indicated.更多还原