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晶粒尺寸对薄膜电阻率温度系数的影响

EFFECT OF GRAIN SIZE ON TEMPERATURE COEFICIENT OF RESISTIVITY OF Pd THIN FILMS

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【作者】 王晓平赵特秀季航梁齐董翊

【Author】 WANG XIAO-PING ZHAO TB-XIU JI HANG LIANG QI DONG YI Department of Physics,University of Science and Technology of China,Hefei 230026(Receivcd 15 April 1993)

【机构】 中国科学技术大学物理系

【摘要】 报道了Pd薄膜电阻率温度系数(TCR)随不同薄膜厚度和不同退火温度的变化.实验结果表明:薄膜TCR值远小于体材料的值,且对晶粒尺寸有一定的依赖关系;薄膜晶粒尺寸越大,其TCR值也越大。采用晶粒间界散射的二流体模型对此结果进行了讨论。

【Abstract】 The temperature coefficient of resistivity(TCR)of Pd thin film with differentthicknesses and annealled at different tempertures has been investigated.Tbe experi-mental results indicated that the TCR value of thin films is much smaller than thatof bulk material and it also depcnds on grain size of the tbin films.It was foundthat tbe TCR is higher for larger grain size,The result is explained readily byusing the twofluid model。

  • 【文献出处】 物理学报 ,ACTA PHYSICA SINICA , 编辑部邮箱 ,1994年02期
  • 【分类号】O484.42
  • 【被引频次】29
  • 【下载频次】445
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