【摘要】 本文是将主路径敏化法［５］扩展到三态器件，介绍了一个针对含三态器件电路的测试生成算法，用１７个逻辑值描述电路．使用分离电路模型来降低算法复杂性，通过动态计算故障相关性和三态相关性，压缩搜索空间，减少一致性操作中的矛盾次数．同时保证故障敏化总是在有效路径上进行，减少回溯次数，提高测试生成效率．更多还原

【Abstract】 The algorithm, for circuits with tristate devices, is described in this paper. This algorithm with the seventeen value description, based on the principal path algorithm,can generate a complete test set for stuck-at 0 or I fault. The search space is reduced by the split circuit model and the dynamic calculation of the fault relation and the tristate relation. Therefore the number of backtrack is reduced and time is saved.更多还原