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InxGa1-xAs/GaAs应变量子阱光学性质
OPTICAL PROPERTIES OF InxGa1-xAs/GaAs STRAINED LAYER QUANTUM-WELLS
【摘要】 研究了用分子束外延方法生长在GaAs(100)衬底上的InxGa1-xAs/GaAs(x=0.1)应变多量子阱样品,观察了其光荧光谱和光调制反射谱的光谱结构,讨论了有关基态光跃迁和激发态光跃迁性质.根据实验结果给出了能带偏移比值为Qc=0.69(Qv=1-Qc=0.31),并提出有关轻空穴束缚于GaAs层而形成Ⅱ类超晶格的重要佐证.
【Abstract】 Structures have been observed in the photoluminescence (PL) and the photoreflectance (PR) spectra of InxGa1-xAs/GaAs (x = 0.1) strained-layer multiple quantum-wells (QWs) grown by molecular-beam epitaxy on GaAs (100)-oriented substrate. The properties of the ground state transitions and the excited state transitions are discussed. The band offset ratio Qc = 0.69 (Qv = 1 - Qc = 0.31) is given based on the analysis of PL, PR experimental results. An important evidence, which indicates that the light holes are confined in the GaAs layer forming a type II superlattice, is provided.
【Key words】 InxGa1-xAs/GaAs; strained-layered quantum well; band offset.;
- 【文献出处】 红外与毫米波学报 ,Journal of Infrared and Millimeter Waves , 编辑部邮箱 ,1994年05期
- 【分类号】O472.3
- 【被引频次】1
- 【下载频次】67