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失配应力引起的GaxIn1-xP外延层能带隙的移动
THE EFFECT OF MISMATCH STRAIN ON ENERGY BAND-GAP IN GaxIn1-xP EPITAXIAL LAYERS ON (100) GaAs SUBSTRATES
【摘要】 本文首次观察了用MOCVD方法生长的GaxIn1-xP外延层的能带隙移动,并给出了GaxIn1-xP外延层光荧光(PL)峰能量随组分x的变化关系,结果表明PL是探测混晶组分的简单而有效的方法之一。
【Abstract】 inter facial elastic strain induced by the lattice parameter mismatch between epilayer and substrate results in significant energy band-gap shift for GaxIn1-xP epitaxial layers.The energy band-gap shift was determined by comparing the photoluminescence peakenergies of the as-grown GaxIn1-xP layer with those from free-standing layer removed fromthe GaAs substrates. We found that photoluminescence is a accurate means to measure composition.
- 【文献出处】 光谱学与光谱分析 ,SPECTROSCOPY AND SPECTRAL ANALYSIS , 编辑部邮箱 ,1994年03期
- 【分类号】O471.5
- 【下载频次】58