节点文献

PECVD方法制备SnO2气敏薄膜的电子显微镜研究

Electron Microscope Investigqtion of SnO2 Gas Sensing Films Prepared by PECVD

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 赵永生阎大卫马晓翠康昌鹤邹慧珠

【Author】 Zhao Yongsheng;Yan Dawei;Ma Xiaocui;Kang Changhe;Zou Huizhu(Jilin University,Changchun,130023,China)

【机构】 吉林大学

【摘要】 通过SEM、TEM研究了PECVD方法制备的SnO_2薄膜的显微结构,讨论了沉积速率与颗粒大小的关系;在Si、陶瓷和KBr3种不同衬底上沉积的SnO_2薄膜的差异以及退火对SnO_2膜结晶状态的影响。结果表明,PECVD方法制备的SnO_2薄膜是非晶态,具有柱状结构。退火使非晶SnO_2膜向着多晶方向转化,演化过程为:非晶大颗粒→超微粒多晶→晶粒长大。

【Abstract】 The microstructure of SnO2 films prepared by plasma enhanced Chemical vapour deposition(PECVD)was studied by SEM and TEM.IT isfound that grain size of the SnO2 films is obviously influenced by the rate of deposition,the annealing processes and substrates,on which thefilms are grown.The results show that the unan-nealed SnO2 films,predpared by PECVD,are amorphous with a columnar strLicture and the thermalannealing samples are polycrystalline,During thetransform process from the arnorphous state to thepolycrystal grain size of the films decreses clearly,when the temperature high enough and the polycrystal grain size begins to increase.

【关键词】 等离子体化学气相沉积SnO_2薄膜显微结构
【Key words】 PECVDSnO2 filmsmorphology
  • 【文献出处】 功能材料 ,JOURNAL OF FUNCTIONAL MATERIALS , 编辑部邮箱 ,1994年02期
  • 【分类号】TN16
  • 【被引频次】4
  • 【下载频次】69
节点文献中: 

本文链接的文献网络图示:

本文的引文网络