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热丝法低温生长硅上单晶碳化硅薄膜
Growth of SiC Single Crystal Film on Si at Low Temperature by Hot Filament Chemical Vapor Deposition
【摘要】 提出了热丝化学气相淀积法,在低温(600-750℃)下成功地生长出硅上单晶碳化硅薄膜,X光衍射谱、喇曼光谱证实了外延膜的单晶结构,光致发光测量证明外延SiC材料室温下可稳定发射可见光。
【Abstract】 A new SiC film growth method- hot-filament chemical vapor deposition(HFCVD) has beendeveloped,which is successfully used to grow single crystal SiC films on Si substrates at low temperature(600-750℃). The results of X-ray diffraction analysis and Raman scattering spectroscopy indicated theexistence of a monocrystalline structure of the epilayer.Visible light emitting was observed inphotoluminescence experiments at room temperature.
【关键词】 热丝法;
低温生长;
碳化硅;
单晶;
薄膜;
【Key words】 Hot filament method; Low temperature growth; Silicon carbide; Single crystal; Thinfilm;
【Key words】 Hot filament method; Low temperature growth; Silicon carbide; Single crystal; Thinfilm;
【基金】 国家教委跨世纪人才专项基金,国家自然科学基金
- 【文献出处】 高技术通讯 ,HIGH TECHNOLOGY LETTERS , 编辑部邮箱 ,1994年11期
- 【分类号】TB43
- 【被引频次】7
- 【下载频次】123