【摘要】 薄膜厚度的测量是薄膜科学的重要分支之一，本文讨论用迈克尔逊干涉仪观察白光等厚彩色干涉条纹方法，从而确定薄膜的厚度和折射率，该方法的优点是测量精度高，原理简单，在一次测量过程中可同时确定薄膜的厚度和折射率。更多还原

【Abstract】 The measurent of film thickness is one of the important branches of film science.The paper discusses the method for observing color interference fringes of equivalent thickness of white light by using Michelson interferomter so that film thickness and refracture index are determined.The method has such advantages as high precision in measurement,simplicity in principles and the capability of determining film thiciness and refracture index in the meantime just in one measurement.更多还原