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金刚石薄膜缺陷的激光拉曼光谱分析
Laser Raman Spectra Analysis of Defects in CVD Diamond Films Deposited on Silicon Substrate
【摘要】 本文分析了不同基板温度下在单晶硅衬底上沉积的金刚石薄膜的激光拉曼光谱特征。根据这些拉曼光谱的特点,讨论了金刚石膜中存在的几种缺陷,如内应力、SP~2态碳等。此外,对金刚石膜作光荧光分析表明,金刚石膜还存在点缺陷,如中性空缺,其零声子线(ZPL)位于1.677eV处。
【Abstract】 The Laser Raman spectra characteristics of diamond thin film deposited on sili-con substrate at 800℃~900℃ are analysed. The defects in diamond thin film, such as stress andSP2 carbon cluster ate discussed from Laser Raman spectra analysis results. Further photolumincespectrum result of diamond thin film obtained at 840℃ showed that there is other defects such asneutral vacancy in diamond film, the ZPL of this neutral vacancy centered at 13530cm-1 or1. 677eV.
- 【文献出处】 磨料磨具与磨削 , 编辑部邮箱 ,1993年04期
- 【被引频次】11
- 【下载频次】315