节点文献
MF-11型NTC热敏电阻失效机理分析
An Analysis of the Feilure Mechanism of the NTC MP 11 Type Thermistors
【摘要】 对MF-11型热敏电阻器的失效样品进行了比较系统的观测与实验分析,从中总结出其主要失效模式.认为它的主要失效机理有:阻值漂移及老化不足,电极有效面积减少,内部微裂纹的蔓延与扩展,非平衡态的转变过程,晶粒表面态的变化等.对提高产品的可靠性提出了改进建议.
【Abstract】 Observations and experiments have been carried out on failed samples of the MF-11 type thermistors. The main failure modes have been summarized. It is believed that the failure mechanism includes the resistance drift, insufficiency of aging, a decrease of the effective electrode area, the extension of the insied micro-crazing, the transformation of the non-equilibrium state and the change of the surface states of the crystalline grains. To improve the re-liabtility of the MF-11 type thermistors, some recommendations are given.
【关键词】 热敏电阻器;
失效模式;
失效机理;
有效电极面积;
内部微裂纹;
【Key words】 thermistors; failure modes; failure mechanism; effective electrode area; inside micro-crazing;
【Key words】 thermistors; failure modes; failure mechanism; effective electrode area; inside micro-crazing;
- 【文献出处】 华中理工大学学报 , 编辑部邮箱 ,1993年02期
- 【被引频次】7
- 【下载频次】251