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GaAs器件中载流子非稳态输运的蒙特卡罗模拟

Monte Carlo Simulation of Carrier Nonsteady-State Transport in GaAs Device

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【作者】 王维航叶润涛郭妙泉余志平

【Author】 Wang Weihang/Department of Electronic & Information Engineering, Zhejiang UniversityYe Runtao/Department of Electronic & Information Engineering, Zhejiang UniversityGuo Miaoquan/Department of Electronic & Information Engineering, Zhejiang UniversityYu Zhiping/Institute of Microelectronics,Tsinghua University

【机构】 浙江大学信息与电子工程系清华大学微电子学研究所 杭州 310008杭州 310008北京 100084

【摘要】 本文用多粒子蒙特卡罗方法对GaAs器件中的载流子非稳态输运过程进行了模拟,解释了载流子速度过冲效应对亚微米器件性能的影响。给出了一种由P集电区、P~+缓变基区和AlGaAs/GaAs异质发射结组成的N~+P~+PN新结构,预计将对缩短基区-集电区渡越时间有明显的作用。

【Abstract】 The nonsteady-state transport of the carriers in GaAs device is simulated by using themultiparticle Monte Carlo method. The results can explain the action of velocity overshoot effectof carriers for performance of the submicro devices, A new N~+P~+PN~+ structure consistingof a P-collector, a P~+-base and a AlGaAs/GaAs heterojunction emitter is supposed to obviouslyreduce the carrier transit time in the base and collector region.

  • 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,1993年08期
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