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射频等离子体沉积类金刚石膜微结构的表征
Microstructure Characterization of r.f.Plasma-Grown Diamondlike Carbon Films
【摘要】 利用傅里叶变换红外光谱仪和X射线激发的CKLL俄歇谱的一次微分表征了类金刚石(DLC)膜的微结构。指出在高离子能量轰击和低CH4压强下所形成的DLC膜内以sp3C-C键为主,并且sp3碳成分随V/Pa1/2 增加而增加,与退火温度从200℃ 到800℃无关,DLC膜具有好的热稳定性。DLC膜密度研究指出:膜密度与沉积参量和基底材料有关。
【Abstract】 Microstructure of diamondlike carbon(DLC)films were characterized using Fourier transformIR spectroscopy and CKLL first-derivative X-ray excited Auger electron spectra.Theseexaminations show that sp3 C-C bonds are dominate in DLC films formed under high ion bombardmentenergy and low CH4 pressure, and sp3 carbon component increases with V/Pa1/2,DLC films have good thermal stability whatever the annealing temperatures ranging from200-800℃. An investigation of the densities of DLC films showed that the densities of films are ralatedto deposition parameters and substrate material.
- 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,1993年01期
- 【被引频次】2
- 【下载频次】48