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金属有机源分子束外延(MOMBE)生长GaAs
The Growth of GaAs by MOMBE
【摘要】 利用国产第一台CBE设备成功地外延生长了GaAs材料,大量观测表明,MOMBE生长的GaAs没有椭圆缺陷。详细分析了衬底温度对生长速率的影响,着重研究了Ⅴ/Ⅲ比与外延层背景载流子浓度的关系,利用优化的条件,获得了较高质量的外延层。
【Abstract】 Undoped GaAs films are grown successfully with the first homemade MOMBE (CBE, GSMBE) equipment. On the epilayer surface of GaAs no oval defect is observed that usually appear on MBE GaAs surface. The optimum growth temperature is about 450~500℃. The examination of the growth process indicates that the carrier concentration of the undoped GaAs films decreases as the As4 pressure increases at a constant TEGa flow rate. The Hall mobility of the carriers in P-type film is 415 cm2/v · s(RT), the carriers concentration is 1.6×1014cm-3. This result indicates a low level compensation in the GaAs epilayers.
【Key words】 MOMBE; GaAs; Oval defects; Ⅴ/Ⅲ ratio; As4 Pressure;
- 【文献出处】 高技术通讯 ,High Technology Letters , 编辑部邮箱 ,1992年06期
- 【分类号】TQ133.51
- 【下载频次】17