【摘要】 我们依据 Bean 临界态模型通过计算给出了不同几何形状超导样品的临界电流密度在各向同性情形下与样品尺寸,剩余磁化强度的诸关系式,给出了利用测量样品磁滞回线求临界电流密度诸公式一个简单统一的方法,为测量磁临界电流密度提供了较全面的参考依据.更多还原

【Abstract】 This paper presents the dependences of isotropic critical current density on the dimension and the remanent magnetization of different-shaped parallelepiped samples based upon simple Bean critical state model, and offers a simple and generalised method for the derivation of jc from magnetic hysteresis loops, thus provides reference for the determination of magnetization critical current density.更多还原