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多元逻辑电路(DYL)线性“与或”门均匀性的研究

Study of uniformity of multicell-type logic circuit (DYL) linear "and/or" gates

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【作者】 马平西魏希文邹赫麟

【Author】 Ma Pingxi, Wei Xiwen, Zou Helin (Dept. of Physics,DUT )

【机构】 大连理工大学物理系大连理工大学物理系

【Abstract】 Comparing the theoretical ana1ysis with the experimental results the authors have proved that the uniformity of linear "and/or" gates mainly depends on imput voltage and load resistance. When imput voltage is low, the uniformity changes a little with the load resistance. When imput voltage is high, the smaller the load resistance is, the more obviously the uniformity changes with imput voltage.

  • 【文献出处】 大连理工大学学报 ,Journal of Dalian University of Technology , 编辑部邮箱 ,1992年04期
  • 【下载频次】24
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