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多元逻辑电路(DYL)线性“与或”门均匀性的研究
Study of uniformity of multicell-type logic circuit (DYL) linear "and/or" gates
【Abstract】 Comparing the theoretical ana1ysis with the experimental results the authors have proved that the uniformity of linear "and/or" gates mainly depends on imput voltage and load resistance. When imput voltage is low, the uniformity changes a little with the load resistance. When imput voltage is high, the smaller the load resistance is, the more obviously the uniformity changes with imput voltage.
【关键词】 逻辑电路;
均匀性;
误差理论/线性“与或”门;
【Key words】 logic circuits; uniformity; error theory/linear "and/or" gates;
【Key words】 logic circuits; uniformity; error theory/linear "and/or" gates;
- 【文献出处】 大连理工大学学报 ,Journal of Dalian University of Technology , 编辑部邮箱 ,1992年04期
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