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双束溅射淀积DLC膜的结构表征和性能分析
CHARACTERIZATION OF DLC FILMS PREPARED BY DUAL-ION BEAM SPUTTERING DEPOSITION
【摘要】 用双离子束溅射淀积法,在轰击源含不同 CH4流量比的条件下,于玻璃和 Si 基片上淀积了DLC 薄膜。用多种手段对所制备的膜进行了结构表征和性能分析。结果表明,轰击源中 CH4流量比对DLC 膜的结构、形貌及其光、电性能有重要的影响。分析了影响机制,探讨了 DLC 膜的生长机理。
【Abstract】 Using dual-ion beam sputtering deposition method,DLC films were depositedon glass and silicon substrate under different CH4 flow ratios(CH4/(CH4+Ar)from 0% to100%)in bombarding ion source.The structures and the properties of the films were systemati-cally analyzed.It showed that the structures,the morphological characteristics and the proper-ties of the films were strongly influenced by the CH4 flow ratios.The formation mechanism ofDLC films were investigated.
【关键词】 双离子束溅射淀积;
DLC膜;
薄膜生长;
结构;
性能;
【Key words】 Dual-ion beam sputtering deposition; DLC films; thin film growth; structure; properties;
【Key words】 Dual-ion beam sputtering deposition; DLC films; thin film growth; structure; properties;
- 【文献出处】 材料科学进展 , 编辑部邮箱 ,1992年04期
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