【摘要】 氧化锌压敏电阻器漏电流宏观上与电压、温度有关,实质在于电阻体的微观结构。显微观察和X射线衍射分析表明,晶粒大小分布均匀,富铋相广布且其主要组成为γ-Bi₂O₃和α-Bi₂O₃时,其漏电流较低,适当地掺杂如SiO₂,Cr₂O₃,PbO,H₃BO₃,KNO₃等,减低降温速度和烧成后进行热处理,可使漏电流减至最低。更多还原

【Abstract】 Leakage current of varistor is related to voltage and temperature, and caused by its microstructure. Results of microscopic examination and X-ray diffraction analysis show that the even grains, well distributed rich bismuth phases composed by γ-Bi₂O₃ and α-Bi₂O₃ may make leakage current little. By doping some impurities, e. g. , SiO₂, Cr₂O₃, PbO,H₃BO₃, KNO₃ etc., decresing rate of cooling, heattreating the sintered ceramic pieces, the leakage current in varistor can be controlled to least.更多还原