【摘要】 用开管水平液相外延系统从富Te溶剂中生长了不同x值的MCT薄膜。经X射线衍射、Hall电学参数、红外光谱、扫描电镜、X射线能谱仪和电子通道花样分析测试,结果表明:外延薄膜表面平整,光学参数较好,纵向、横向组份均匀,晶体结构完整,电学参数较好,外延膜质量优良。短波材料（n型）:载流子浓度3.54×10¹⁴cm^-3,迁移率1.63×10⁴cm²V^-1s^-1;中波材料（n型）:载流子浓度9.95×10¹⁴cm^-3,迁移率为1.76×10⁴cm²V^-1s^-1;原生长波材料（n型）:载流子浓度为2.15×10¹⁵cm^-3,迁移率2.00×10⁴cm²V^-1s^-1。更多还原

【Abstract】 The growth of Epitaxial films of Mercury Cadmium Tellurid（MCT） with various x values from Te-rich solution in an open tube sliding system is studied. LPE films of MCT have been grown on CdTe substrates and their high quality has been confirmed by Infrared transmission, X-ray Diffraction, Hall and composition measurements. Typically the FWHM value is 158 arc. second, the hole concentration 3.15×10¹⁶cm^-3, the Hall mobility 1532.6cm² V^-1 s^-1 for x=0.315 MCT film; the electron concentration 2.15×10¹⁵cm^-3, the Hall Mobiliiy 20024.1cm² V^-1 s^-1 for x=0.200 as-grown MCT film.更多还原