【摘要】 本仪器利用X射线荧光分析原理和微机技术研制而成的。以小型X射线管作激发源,射线用小孔准直,样品用光学定位,样品最小测量面直径为0.1mm。微机多道实时显示能谱。它能快速、精确、无损测量多种微小面积上的单、双涂层厚度和合金涂层厚度及成分,结果由屏幕显示并打印输出,还能作统计处理。更多还原

【Abstract】 This instrument was based on the XRF technique and microcomputer. X-ray radiation from a small X-ray tube was collimated with a small hole and the emitted fluorescence spot at the surface of a sample could be seen with an optical microscope. The minimum diameter of the measuring area was 0.1mm. A microcomputer-based MCA was used. The unit was able to measure thickness of either single or double coating layers noEdestructively and determine thickness and composition of an alloy coating layer simultaneously.更多还原