【摘要】 近年来,SnO₂超微粒子薄膜在气敏材料上的应用引起了人们极大的兴趣。薄膜的粒子大小和形状直接影响到它的性能。作者利用X射线宽化法测定了粒子的平均大小。自编程序可对衍射峰的K_α双线进行分离。又以碳化钨粉为标样制定了通用仪器宽度曲线,使测定比较迅速准确。从数据采集到分析计算可实现自动化。测定结果表明:在几个晶体学方向上,薄膜中的粒子平均大小均在百埃（10纳米）以内,符合超微粒子的要求。文章尚对晶格畸变的影响进行了探讨。更多还原

【Abstract】 People are interested in the applications of tin oxide ultrafine particle films used as a gas sensitive material in recent years. Size and shape of the particles have immediately influence on the properties of the films. The authors determined the mean crystallite dimensions from X-ray diffraction line broadening. The determination was quite quick and precise, as they made a programme to separate the K_α doublet and a curve for correction of instrumental factors (instrumental breadth vs. diffraction angle, tungsten carbide used as a standard). The results indicated that the mean dimensions at several crystallographic directions were within 10nm and that was just in the range of ultrafine particles.The influence of strain was also studied.更多还原