【摘要】 本文主要阐述了标准物质SiO₂的制备与研究以及用AES测定其界面宽度时的各种影响因素。文献综述了三种界面宽度的计算方法和修正因子,并指出了各自的优缺点。更多还原

【Abstract】 This paper describes the development of a standard reference material-SiO₂ and different influence factors in the interface width measurement by AES. Three computing methods and correcting factors are summarized, and their merits and demerits are indicated, respectively.更多还原