节点文献
Ni-Cr-Si系钎焊料薄膜样品的制备技术及TEM研究
A TECHNIQUE FOR PREPEARATION OF THIN FILM SPECIMEN OF Ni-Cr-Si-BASE BRAZING FILLER AIIOYS FOR TEM STUDY
【摘要】 Ni-Cr-Si系合金具有很高的脆性,因而对该系统钎焊料的相分析研究大都采用X射线衍射及SEM技术。本文介绍了采用电解双喷及离子薄化技术制备出了较为满意的国产Ni-Cr-Si系统钎焊料的金属薄膜样品,并进行了TEM观察。研究表明:该系统钎焊料可以制成金属薄膜样品进行TEM研究,其内部具有丰富的微观相结构。
【Abstract】 Ni-Cr-Si-base brazing filler alloy is a very brittle alloy, therefore, it is very difficult to prepare the thin film specimen for TEM study. In this paper, an electrolytic double jet polishing and ion mill technique were carried out to prepare the thin film specimen of Ni-Cr-Si-a baselloy for TEM study, and we have got success. By means of this technique and TEM, the microphase structure of Ni-Cr-Si bnse alloy were investigated also.
- 【文献出处】 理化检验.物理分册 ,Physical Testing and Chemical Analysis (Part A:Physical Testing) , 编辑部邮箱 ,1990年01期
- 【分类号】TG425
- 【下载频次】22