【摘要】 <正> 非晶态TiO₂-SiO₂材料,由于Ti的掺杂破坏了均匀的SiO₄四面体网络结构,造成Si—O键和Ti—O键断裂而形成三种缺陷:非桥氧,E′心和过氧基。伴随Si—O断键生成的E′心其能带结构如图1所示。价带为完整的SiO₄四面体网络的基态。导带底相应于氧原子的2p电子激发到3s轨道。更多还原

【Abstract】 The existence of E centers, one of the network defects in TiO₂-SiO₂, was identified using the thermoelectroluminescence effect of the irradiated materials by radiative rays. The quantity of the defects tends to, saturation with increasing TiO₂ content up to 7 wt%.更多还原