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COMPOSITIONAL ANALYSIS OF HIGH-TEMPERATURE SUPERCONDUCTOR THIN FILMS BY HIGH ENERGY ELASTIC BACKSCATTERING OF HELIUM IONS

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【作者】 吴士明； 承焕生； 张承霆； 要小未； 赵国庆； 杨福家； 华中一；

【Author】 Wu Shiming Cheng Huansheng Zhang ChengtengYao Xiaowei Zhao Guoqing Yang Fujiaand Hua Zhongyi(Fudan University, Shanghai 200433, China)

【机构】 Fudan University Shanghai 200433 China； Fudan University Shanghai 200433 China；

【摘要】 <正> High energy ion backscattering can be used to enhance the sensitivity of oxygen analysis. At He++ ion energy of 8.8 MeV, the yield due to oxygen is about 25 times larger than that predicted by Rutherford formula. The elemental stoichiometry of some bulk and thin film superconductor samples was determined. The details of the measuring method are discribed.

【Abstract】 High energy ion backscattering can be used to enhance the sensitivity of oxygen analysis. At He++ ion energy of 8.8 MeV, the yield due to oxygen is about 25 times larger than that predicted by Rutherford formula. The elemental stoichiometry of some bulk and thin film superconductor samples was determined. The details of the measuring method are discribed.

【关键词】 High energy ion backscattering High temperature superconductor；
【Key words】 High energy ion backscattering High temperature superconductor；
  • 【文献出处】 Nuclear Science and Techniques ,核科学与技术(英文版) , 编辑部邮箱 ,1990年Z1期
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