【摘要】 本文介绍了大截而KDP杆晶的培养和单晶的生长以及用光学、X射线形貌术和双晶衍射方法对大截而[xy≥200×200(mm)~2]KDP晶体中位错密度的检测。并根据生长锥的形态对位错密度的影响,提出了对控制位错的看法。更多还原

【Abstract】 The seed culture and growth of KDP crystals with large cross section [xy≥200×200(mm~2)]have been observed by using common optical and X-ray topographical methods as well as double crystal diffractometry (n, -n). Based on the effect ot growth pyramidal morphology on their dislocation density, a method for eontrolling dislocation is briefly reeommended.更多还原