【摘要】 <正> 一、引言 电子器件尤其是功率器件,芯片的发热是通过外壳将热量散走。外壳热阻将严重影响功率管的散热性能。为了给功率管提供散热性能良好的外壳,测试外壳热阻是十分必要的。根据功率晶体管的热阻概念引进外壳热阻的定义。功率晶体管的热阻是芯片更多还原

【Abstract】 This paper provides an introduction of a new tool-laser probe. It can be used as a heat source and a device for measuring temperature and heat flux simultaneously.Laser probe with a data acquistion system can be used to measure, display and print the thermal resistance and thermal conductivity of solid materials. Measurements of these parameters of a reference material such as stainless steel were made with using this probe. Its results agree with the literature values within 8%.Measurements of the resistance of microwave transistor packages were made with this probe. The results are satisfactory.更多还原