节点文献
共路剪切条纹扫描干涉仪
Common Path Searing Fringe Scanning Interferometer
【摘要】 本文论述共路剪切扫描干涉仪原理,提出两种共路剪切干涉系统及一种新的条纹扫描方法。该干涉仪能有效地对光学表面、透镜进行精密检测,特别适用于光学非球面的检测,电适用于在没有严格环境控制的加工现场,对光学元件进行实时检测。
【Abstract】 The operation principle of common path shearing fringe scanninginterferometer is described.Two types of common interference systems and anew phase modulation method are introduced.This interferometer is an effe-ctive instrument to measure optical surfaces and lenses especially for mea-suring asphrical.The system can be used in the optical shop field testing.
- 【文献出处】 仪器仪表学报 ,Chinese Journal of Scientific Instrument , 编辑部邮箱 ,1989年03期
- 【被引频次】2
- 【下载频次】44