【摘要】 <正> 一、引言在X光激光(XRL)和惯性约束聚变(ICF)研究中,等离子体电子温度和密度是表征等离子体状态的重要参数之一。虽然等离子体辐射各谱线强度与发射源的温度,密度和离子丰度直接相关,但要得到各谱线的绝对强度是很困难的,因为用于测量谱线强度探测器的绝对刻度相当困难。早在70年代初,苏联Aglitskii等首次用类He离子谱线强度比测量等离子体电子温度和密度。由于用该方法测量等离子体电子温度和密度可避免对探测器绝对更多还原

【Abstract】 The measurement of density and temperature of a laser-produced plasma through relative intensity ratios of helium-like ion spectra is described. The X-ray spectrum is recorded on kodak AA5 films with a flat-crystal spectrograph. Based on film exposure measurments of an X-ray spectrum transmitted through a step-wedge absorption filter, characteristic curves for kodak AA5 film were obtained.更多还原