节点文献
利用导波光学方法测量光学薄膜材料的色散特性
Measurement of Chromatic Dispersion Characteristics of Optical Thin Films by Guided Wave Optical Method
【摘要】 导波光学方法能够用来测量光学薄膜的特征参数,但通常只在单一波长条件下进行。本文将这种方法推广应用到一定光谱范围内的测量,从而研究薄膜材料的色散特性。
【Abstract】 The guided wave optical method can be applied to measurement of characteristic parameters of optical thin films, but usually can only be carried out under the conditions of single wavelength. This method can be spread to the measurement of certain spectral range to investigate the chromatic dispersion characterstics of thin films.
- 【文献出处】 光学工程 , 编辑部邮箱 ,1989年06期
- 【被引频次】1
- 【下载频次】63