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SnO2薄膜的红外光谱和表面光电压谱的研究

Study on IR SPV Spectram of the SnO2 Films

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【作者】 戴国瑞姜月顺王雅静董玺娟汤大新李铁津

【Author】 Dai Guorui/Jilin University, ChangchunJiang Yueshun/Jilin University, ChangchunWang Yajing/Jilin University, ChangchunDong Xijuan/Jilin University, ChangchunTang Daxin/Jilin University, ChangchunLi Tiejin/Jilin University, Changchun

【机构】 吉林大学吉林大学 长春长春长春

【摘要】 本文采用PECVD方法制备了SnO2薄膜,对薄膜进行了红外光谱和表面光电压谱测量发现,薄膜表面化学吸附O22-和O-离子基团,成为反应活性中心、电子转移的桥梁,推测了SnO2表面与乙醇气体敏感反应历程.SnO?薄膜淀积在n-Si上,使其表面光电压信号增强二个数量级以上,我们认为是SnO2/n-Si异质结作用和消反射作用的结果.

【Abstract】 This paper reports the preparation of the tin dioxide films deposited at 170℃ by meansof the plasma enhanced chemical vapor deposition (PECVD) and measure ments of infraredspectrum and surface photovoltaic spectrum.The experimental results show that two species ofO22- and O- are chemisorpted on the surface of the SnO2 films as sensing activators of the re-action and medium of the charge transfer.The sensing mechanism of the SnO2 films to thealcohol (C2H5-OH) is given.For a SnO2 film deposited on an n-Si wafer, the surface photo-voltaic relative intensity increases over two orders of magnitude. We attribute the effect tothe action of the heterojunction and antireflection.

  • 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,1989年11期
  • 【被引频次】7
  • 【下载频次】153
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