【摘要】 本文介绍了一套基于直流电位法的Apple-Ⅱ微机疲劳裂纹扩展的数据采集与处理系统。该系统具有电位采集和裂纹监测,绘出da/dN～⊿a和da/dN～⊿K曲线,求出Paris公式da/dN=A(⊿K)~m中参数A,m的功能。附录中给出了一个完整的应用实例。更多还原

【Abstract】 A set of Apple-Ⅱ microcomputer fatigue crack propagation data acquisition and processing system based on direct electric potential drop method is introduced in this paper, it can perform the functions of acquiring electric potential value, monitoring cacrk lemgth, drawing da/dN～⊿a and da/dN～⊿K curves, deriving the values of para: eters A and m in Paris formula da/dN=A(⊿K)~m. A corplete applied example is given in the Appendix of this paper.更多还原