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光纤表面粗糙度测量仪线路及其智能化

An Instrument for Measuring Surface Roughness with Optical Fibre Probe and Its Intelligence System

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【作者】 陈志祥; 胡昌华; 戴泽西;

【Author】 Chen Zhixiang Hu Changhua Dai Zexi

【机构】 华中工学院机械工程一系; 华中工学院机械工程一系;

【摘要】 本文研究了一种新型光纤表面粗糙度测量仪主要线路的设计、调整和仪器智能化等问题。改进后的线路使仪器的测量范围扩大,能测量R_α=6.3~0.005μm的表面粗糙度,示值稳定性可达0.075%。

【Abstract】 A new instrument for measuring the surface roughness with an optical fibre Is described at length with its intelligence system including hardware and software given. The surface roughness from Ra = 0.005μm to 6.3μm can be inspected and the measurement reproducibility is found to be in the range of 0.075-0.1%.The circuit in the instrument developed consists of nine components: I/V converter, pre-amplifier, bandpass and low-pass filter, divider, antilog amplifier, A/D converter, single chip microcomputer, display and keyboard. The output from the antilog amplifier isThe design and adjustment of bandpass filter, phase sensitive detector and divider in the instrument are described. The centre frequeucy of the bandpass filter is f0 = 352 Hz. The maximum output voltage Vo4F of the phase sensitive detector is equal to V0sF/[2π(R5 +R)c1w0]. An analog device AD533L is used in the circuit as a divider.The intelligence system consists of a MCS-48 series chip of 8039 model, EPR-OM 2716, display, A/D converter 0808 and a keyboard. The system is provided with learning and Ra display functions.

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