【摘要】 用XPS(X射线光电子能谱法)研究了十余种掺杂聚乙炔的电荷转移过程,发现对大部分掺杂剂,由C1s谱裂分所计算的电荷转移量与掺杂剂的氧化电位直接相关.一些强氧化性或过渡金属质子酸也符合这一规律,同时观察到掺杂后这些氧化性质子酸本身发生价态变化.因此这些质子酸的掺杂不是文献中所报道的质子酸机制而是氧化还原机制.所研究的若干种非氧化性或弱氧化性质子酸掺杂后电导率均较低,这进一步表明掺杂过程中的电荷转移过程是产生高导聚乙炔的必要条件.更多还原

【Abstract】 Doping mechanism of polyacetylene was studied by XPS method. It was found that the charge per carbon atom in the metallic region are closely related to the oxidation potential for both electron acceptor and oxidative protonic type dopants. For doping with strongly oxidative protonic acid such as HClO₄, H₂SO₄ etc. the charge transfer from polyacetylene chain to the dopant molecule and simultaneous reduction of dopant molecule to the lower valence state were observed by XPS studies. For nonoxidative or weakly oxidative protonic acid dopants the maximum doping level and the electrical conductivity achieved were much lower than that in the case of charge transfer process. It seems to be the charge transfer from polyacetylene chain to the dopants is necessary for obtaining highly conductive materials on the doping of conjugated polymers.更多还原