【摘要】 选用国产CR-39测量α粒子的实验研究结果表明:该材料经α标准源照射后,加以化学预蚀刻、电化学蚀刻,可得到清晰的树状径迹。在入射条件一致情况下,α粒子注量与产生的径迹密度呈线性关系。相对探测效率为20％。平均本底径迹为0.2个/mm~2。更多还原

【Abstract】 Experiments of using home made CR-39 films to register alpha-particles were carried out. After exposing the CR-39 film to an alpha source, distinct tree-like tracks on the foil had been found by using reasonable chemical and electrochemical etching treatment. Under the identical exposure condition, there was a linear relationship between alpha-particle fluence and track density. The relative register efficiency was 20% and average background tracks 0.2/mm2.更多还原