【摘要】 电淀积工艺制备 CdSe_xTe_1-x薄膜,经 x 射线衍射分析,肯定薄膜是以 CdSe 为基的三元单相固溶体,其结构并非严格的立方闪锌矿结构,应属正交晶系;随着退火温度升高正交性不断加强,高温700℃退火除正交性加剧外,还出现许多新谱线,它与六角闪锌矿结构不符而与正交结构的超点阵结构谱线吻合;这种情况的出现可能与 Te 和 Se 原子有规则占据四面体间隙位置引起长程有序化有关。更多还原

【Abstract】 The CdSe_xTe_1-x thin films are obtained by cathodic deposition and ana-lysed by X-ray diffraction.It approved that the films are single phase ter-nary solid solutions on the basis of CdSe,the structure is not strict cubiczinc blende structure,it belongs to orthorhombic system.When the annea-ling temperature raises,the orthorhombic character is enhanced gradualy.Ifthe thin film anneaed at temperature 700℃,many new diffraction lines areappeared.These lines are different from Wurtizte structure but agreementwith uperlattice structure lines of orthorhombic structure.It show sthat theatom of Te and Se perhaps regulary occupy tetrahedral interstic,which leadto long-range ordering.更多还原