节点文献
轮廓仪微机系统
A Microcomputer System for Profile Meter
【摘要】 本文叙述了一种可以与触针式轮廓仪配用的微机系统,利用该系统可以测量R_a、R_q、R_y、R_z、R_m、R_p、S、S_m、tp%等表面粗糙度参数,测量精度不低于原轮廓仪的精度。
【Abstract】 This paper introduces a microcomputer system fitted for the stylus profile meter.Surface roughness parameters,such as R_a,R_q,R_y,R_z,R_m,R_p,S, S_m,and tp% etc,can be measured by this system.The measuring precision is not lower than that of the original profile meter.
- 【文献出处】 宇航计测技术 ,Journal of Astronautic Metrology and Measurement , 编辑部邮箱 ,1987年02期
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