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透明薄膜热辐射性质测定方法的研究
A STUDY OF MEASURING THERMAL RADIATION PROPERTIES OF TRANSPARENT FILMS
【摘要】 本文介绍了一种测定透明薄膜衰减系数K_λ的方法。其要点是:1.测定透明薄膜的有效透过率τ_λ~*;2.测定透明薄膜的有效反射率ρ_λ~*;3.利用τ_λ~*=τ_λ~*[ρ_λ,τ_λ=exp(-K_λd)]和ρ_λ~*=ρ_λ~*[ρ_λ,τ_λ=exp(-K_λd)]进行迭代求解,算出K_λ。 本方法的主要优点是,利用衰减系数K_λ,就可以用计算方法确定任意厚度d的透明薄膜的光谱和全波长热辐射性质,即:ρ_λ~*、τ_λ、τ_λ~*、ε_λ和ρ~*、τ~*、ε。 基于所述方法,作者对聚四氟乙烯透明薄膜的热辐射性质进行了论证性测定研究。结果表明,这种方法是可行的。
【Abstract】 In this paper a technique for measuring extinction coefficient Kλof transparent films is presented.The principle of the technique is: 1.measurements of effective tra-nsmissivity 2.measurements of effective reflectivity 3.based on relations to solve for Kλ by an iterative method.The major advantage of the presented technique is that it allows to determine the all thermal radiation properties of films with any thickness d by means of computation using the extinction coefficient KλThe results measured of thermal radiation properties of the polyflon film have proved the technique to be successful.
- 【文献出处】 太阳能学报 ,Acta Energiae Solaris Sinica , 编辑部邮箱 ,1987年01期
- 【被引频次】2
- 【下载频次】91