【摘要】 本文详细讨论了应变片技术,特别是半导体应变片技术在动态力学测量中的若干技术问题,主要有应变片及起动态应变仪的频率响应问题,应变片灵敏系数的动态标定问题。文章指出,随着数据处理微机化的日益普及,半导体材料所存在的非线性特性及拉压不对称性将不再影响到半导体应变片技术的推广使用。相反地,灵敏系数极高这一优良特性将使该项技术获得日益广泛的应用。更多还原

【Abstract】 In this paper the strain gage technique, especially the semiconductor strain gage technique, used in dynamic measurement is discussed in detail. The emphases are laid on the frequency responses of strain gage and the ultra-dynamic strain amplifier as well as the dynamic calibration of the sensitivity coefficient of gage. It is pointed out that, with the micro-computer processing of expe, imental data, nonlinearity and tension-pressuer unsymmetry of semiconductor would not interfere the wide application of semiconductor strain gage technique. Contrarily, due to its high sensitivity coefficient, the semiconductor strain gage technique would more and more extensively be adopted.更多还原