节点文献
聚酞菁硅氧烷的高分辨电子显微术研究
High Resolution Electron Microscopy Study of [Si (Pc) O] n
【摘要】 本文研究了聚酞菁硅氧烷晶粒的结构,拍摄了这种晶体的晶格像,包括(020)晶面条纹像及(020)和(002)晶面的两维晶格像。观察到该种晶体中存在结晶完善的区域和缺陷集中的区域,同时拍摄了聚酞菁锗氧烷的晶格像,比较了这两种同系物的结构。
【Abstract】 The structure of the crystalline grain of [Si(Pc)O]n is studied. The lattice image of(020) plane and two-dimensional lattice image of (020) and (002) on [Si(Pc)O]n are takenIt is shown that there are the well crystalline regions and one amassed by the defects in thecrystals. The crystal structure of [Si(Pc)O]n is also compered with [Ge(Pc)O]n.
- 【文献出处】 电子显微学报 ,Journal of Chinese Electron Microscopy Society , 编辑部邮箱 ,1987年04期
- 【被引频次】2
- 【下载频次】25