【摘要】 本文提出了一种CMOS电路开路故障的测试生成算法,检测开路故障所需的复位输入T₁和测试输入T₂可以一次同时产生,并且能够保证所得的测试是Robust测试。更多还原

【Abstract】 A test generation algorithm for stuck-open faults in CMOS combinational circuits is presented.An initializing input pattern T1 and a test input pattern T2 can be generated at the same time.It is shown that the test (T1,T2) generated using the algorithm is a robust test.更多还原