【摘要】 本文介绍了cu6800功能测试的一种测试方法及程序的研制。这种方法立足于测试技术的先进性、测试程序的有效性、实用性与经济性。以生产厂和用户之间交接产品时共同遵守的测试为宗旨,并对各类不同用户的使用环境提供方便。该方案吸收了一些国际上较先进的测试方法的长处,并有所改进,称为功能与结构兼测法。在对微处理机进行功能测试的同时,加强对弱点(容易出故障的工作部位)的测试。考虑微处理机工作时的内部干扰、信号丢失、传输延时、时钟链、进位链、时钟负载、频率范围(尤其是高低端情况)、逻辑传送、驱动能力等因素。文章说明了功能与结构兼测法的思想及其实现。更多还原

【Abstract】 In the article, a scheme for Cμ6800 microprocessor testing is presented, and the development of a functional testing program is described. The scheme is based on the advancement of test techniques and the effectiveness, practicality and economy of test programs. This testing program is intended as a temporary standard test program which will be accepted by both the users and manufacturers of the microprocessor. It has taken account of providing convenience in different test environments. Having absorbed some quintessences of a number of existing test methods in the world and made improvements on some of them. a new test method which tests microprocessor functionally as well as structurally is developed. This method takes account of the distinguishing features of internal structure of microprocessors especially the ’weak point’ such as internal disturbances, signal losses, transmission delays, margins of frequency range, etc. The overall structure of the testing program and the achievement of this method are introduced.更多还原