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漏轻掺杂MOSFET的特性分析及其解析模型

Characterization and Modeling of LDD MOSFET_s

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【作者】 谢连生; 陈学良; 徐元森;

【Author】 Xie Liansheng/Shanghai Institute of Mctallurgy, Academia SinicaChen Xueliang/Shanghai Institute of Mctallurgy, Academia SinicaXu Yuansen/Shanghai Institute of Mctallurgy, Academia Sinica

【机构】 中国科学院上海冶金研究所; 中国科学院上海冶金研究所;

【摘要】 制作了1μm沟道长度 LDD nMOSFET,其衬底电流较常规结构的 MOSFET降低了两个数量级,击穿电压提高了5伏.此外,还建立了包括热电子速度饱和和串联电阻在内的LDDMOSFET解析模型.

【Abstract】 1μm channel length LDD MOSFET was fabricated with a novel processing technique pro-posed in this paper and characterized by means of the analysis of hot electron injection current,breakdown voltage and series resistance.The results show that the substrate current of the LDDdevices is reduced by 2 orders of magnitude,and the source/drain breakdown voltage is incre-ased by 5 volts as the channel length equals Iμm. In addition, an analytical model which in-cludes hot electron effects is developed for the imulation of LDD MOSFETs.The calculatedsesults are in good agreement with the measured data.

  • 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,1987年06期
  • 【被引频次】4
  • 【下载频次】59
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