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X射线衍射法中本征衍射峰形的测定
THE DETERMINATION OF PURE X-RAY DIFFRACTION PROFILE IN X-RAY DIFFRACTION
【摘要】 本文提出一个从实验衍射峰形和仪器宽化衍射峰形测定本征衍射峰形的新方法。文中对计算模型的建立和递推解法的推导作了详细介绍,还将实验衍射峰形h(∈)的实测值与计算值作了此较,结果符合甚好。
【Abstract】 This paper presents a new method for the procurement of pure X-ray diffraction profile from cxperimental diffraction profile and that of instrumental broadening.Modelling set-up and detailed derivation are given.The calculated values are in good agrecment with those by cxperiments.
- 【文献出处】 中国科学院研究生院学报 ,Journal of the Graduate School of the Chinese Academy of Science , 编辑部邮箱 ,1986年01期
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