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电子出现势谱与次级电子发射

ELECTRON APPEARANCE POTENTIAL SPECTROSCOPY AND SECONDARY ELECTRON EMISSION

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【作者】 吴锦雷; 赵兴钰; 齐彦;

【Author】 Wu Jin-lei, Zhao Xing-yu, Qi Yan, (Department of Radio-Electronics, Beijing University)

【机构】 北京大学无线电系; 北京大学无线电系;

【摘要】 本文探讨了电子出现势谱与收集极材料的次级电子发射之间的关系,得出了次级电子发射系数小的收集极能够提高俄歇电子出现势谱的信号强度。这个结论有利于电子出现势在表面分析中的应用,用Ti做收集极去分析某种不锈钢材料,测到了多种元素成份。

【Abstract】 In this paper, relation between Anger electron appearance potential spectroscopy (AEAPS) and secondary electron emission of collector materials is investigated It is obtained that the collector which has smaller coefficient of secondary electron emission can raise signal intensity of AEAPS. This result is of benefit fo the application of AEAPS on the surface analysis. The stainless steel is analysed when collector is made of Ti, and the spectrum of many elements are drawn.

  • 【文献出处】 真空科学与技术 ,Vacuum Science and Technology , 编辑部邮箱 ,1986年05期
  • 【被引频次】1
  • 【下载频次】25
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