节点文献
核靶厚度和均匀性测量
THICKNESS AND UNIFORMITY MEASUREMENTS OF NUCLEAR TARGETS
【摘要】 本文系统地介绍了核靶厚度和均匀性的测量方法,包括天平称重法、石英晶体测厚法,等效空气α粒子能量损失法,吸光光度法和离子背散射法。这些方法都有各自的特点:石英微量天平的灵敏度高(0.04μg/cm~2);等效空气α粒子测厚仪的测量范围宽;吸光光度法测量快速而背散射法既能测量核靶厚度又能分析靶膜的杂质。将这几种方法结合起来,就能测量不同元素和不同种类核靶的厚度和均匀性。
【Abstract】 This paper introduces the methods of target thickness and uniformity measurements including weighing, a-particle thickness gauge,quartz thickness gauge, optical transmittance and Rutherford backscattering. An a-particle gauging which measures target thicknesses up to several n m is metioned. A fast thickness measurements for C, Au and Cu targets by spectrophotometer is given.A high sensitive quartz gauge which can measure minimum deposit of 0.04ng/cm2 is described.Thickness and impurity determinations by RBS with accuracy better than 5% arc summarized.
- 【文献出处】 中国核科技报告 ,China Nuclear Science and Technology Report , 编辑部邮箱 ,1986年00期
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