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用光截止法测量Hg1-xCdxTe的横向组分均匀性

MEASUREMENT OF THE UNIFORMITY OF TRANSVERSE COMPOSITION OF Hg1-xCdxTe WITH LIGHT-CUT-OFF METHOD

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【作者】 王新德张征明陈新禹

【Author】 WANG XINDE, ZHANG ZHENGMING~*, CHENXINYU(Shanghai Institute of Technical Physics, Academia Sinica)~*Graduated from Shanghai University of Science and Technology in 1985.

【机构】 中国科学院上海技术物理研究所上海科技大学85届毕业生中国科学院上海技术物理研究所

【摘要】 本文以相当可靠的黑体辐射公式为基础,利用Hg1-xCdxTe样品本身的光截止特性测量样品的截止波长,再用Eg-x经验公式求出样品的组分(?)对样品进行二维扫描,获得了Hg1-xCdxTe样品横向组分的面分布。测得的组分均方根偏差与电子探针的测量结果符合得很好。

【Abstract】 The light-cut-off method based on an exceedingly reliable formula for black-body radiation is presented. The cut-off wavelengths of Hg1-xCdxTe sample are measured by use of the light cut-off characteristics of Hg1-xCdxTe, and then the compositions are found through empirical formula of Eg vs x. The transverse composition distribution of Hg1-xCdxTe samples is obtained by use of two-dimensional scan. The measured rms error of the composition is well coincident with the results measured with the method of electric probe.

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