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A3钢基体磁控溅射离子镀铝膜的物相分析
The Identification of Phases on the Magnetron Sputtering Ion Plating Aluminum Films on the Matrix of A3 Steel
【摘要】 本文应用 X射线衍射分析和电子衍射分析研究了A3钢基体磁控溅射离子镀铝 膜的相组成,结果表明,膜的相组成主要是基板负偏压所决定的。文中论述了正离子 对基板的溅射作用所引起的靶材原子和基板(基体)原子在基板上共同沉积的成膜机 理。
【Abstract】 The phases of the magnetron sputtering ion plating aluminum films on the matrix of A3 steel have been examined by means of X-ray diffraction analysis and TEM. The results show that the phases of the films are mainly dependent on the negative bias of the substrate. In this paper, the mechanism of formation of the films is described. The sputtering of positive ions at the substrate brings about target element(Al) ions and substrate element(Fe) ions. The ions of the two elements are mixed and deposited on the substrate, forming the magnetron sputtering ion aluminum plating film on the A3 steel substrate.
【Key words】 ion plating; metal thin films; phase analysis; cathode sputtering; magnetron source/ion plating aluminum films.;
- 【文献出处】 大连工学院学报 , 编辑部邮箱 ,1986年02期
- 【被引频次】2
- 【下载频次】74