【摘要】 我们利用椭偏法对硫化锌薄膜的光学厚度和折射率进行了实时的监控,并利用电子显微镜和X射线光电子能谱仪对硫化锌薄膜的结构和化学成份进行了观察、测量和分析,讨论了硫化锌薄膜的折射率与化学成份、薄膜结构的关系。更多还原

【Abstract】 The optical thickness and refractive index of zinc sulphide (ZnS) thin film are monitored by the elliptic polarization method real-timely. The structure and chemical composition of ZnS film are observed, measured and analyzed by means of electron microscope and X ray-photon spectrometer. The relationship between the refractive index and the film structure, chemical composition is discussed.更多还原