节点文献
微光斑尺寸测试技术
Submicron Spot Size Measuring Technique
【摘要】 光盘录刻系统的一个重要参数是系统的最小可能焦斑尺寸。本文描述一种测量亚微米级焦斑的方便而精确的测量技术。测试装置包括对焦及微调机构;刀口/光检测器扫描部分和光栅读数刀口定位部分。
【Abstract】 The size of the smallest possible focused spot is one important system parameter ofoptical disc recording system.This paper describes a convenient and accurate technique for measuringthe submicron spot.The measuring apparatus consists of three subsystems:(a)focused spot findingand adjusting system;(b)scanning knife-edge/photodetector system;(e)optical 4 dividing gratingsystem which provides a metric for the knife-edge displacement.
- 【文献出处】 应用激光 ,Applied Laser , 编辑部邮箱 ,1985年01期
- 【被引频次】3
- 【下载频次】61