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等离子体工艺参数对非晶硅氢合金中氢的键合性质的影响及氢的释放机理

EFFECT OF PLASMA PARAMETERS ON THE PROPERTIES OF HYDROGEN IN a-Si:H FILMS AND RELEASE MECHANISM OF HYDROGEN IN a-Si:H FILMS

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【作者】 王澄何克伦程如光祁明维

【Author】 WANG CHENG, HE KELUN, CHENG RUGUANG(Shanghai Institute of Ceramics, Academia Sinica)QI MINGWEI (Shanghai Institute of Metallurgy, Academia Sinica)

【机构】 中国科学院上海硅酸盐研究所中国科学院上海冶金研究所

【摘要】 研究了等离子体工艺参数对射频辉光放电沉积的a-Si:H膜中氢的键合状态的影响及氢在退火时的释放机理。结果表明:可以通过不同的制备条件(特別是等离子体压力)控制a-Si:H膜中氢的键合状态。提出了以空间氢聚团模型解释在a-Si:H膜的退火过程中氢的释放机理。

【Abstract】 The effect of preparation parameters on the nature of hydrogen bond in a-Si:H films prepared by r. f. glow-discharge plasma deposition is studied. Also, the release mechanism of hydrogen from a-Si:H films during annealing is discussed. It is found that the nature of hydrogen bond in a-Si: H films can be controlled by varying the preparation parameters, especially the plasma pressure. Concerted hydrogen model is suggested by the authors to explain the mechanism of release of hydrogen from a-Si:H films during annealing.

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